Items where Author is "Ajikumar, P. K."

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Article

Lakshmanan, C. and Viswanath, R. N. and Behera, Anil K. and Ajikumar, P. K. and Rajaraman, R. (2024) Microstructure Analysis of Silicon Nanowalls: Insights from Positron Beam Doppler Broadening Measurements. Silicon, 16 (13-14). pp. 5317-5325. ISSN 1876-990X

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